Influence of the back contact on the electrophysical and functional characteristics of thin-film CdTe Schottky barrier detector structures
To register nuclear radiation, thin-film CdTe Schottky barrier detector structures are developed. The structures are based on large-block p-CdTe films with resistivity ρ = 10 5 – 10 7 Ω∙сm. The capacitance-voltage, current-voltage, amplitude, and noise characteristics of the structures are measured,...
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Published in | Russian physics journal Vol. 55; no. 2; pp. 180 - 185 |
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Main Authors | , , , |
Format | Journal Article |
Language | English |
Published |
Boston
Springer US
01.07.2012
Springer |
Subjects | |
Online Access | Get full text |
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