Influence of the back contact on the electrophysical and functional characteristics of thin-film CdTe Schottky barrier detector structures

To register nuclear radiation, thin-film CdTe Schottky barrier detector structures are developed. The structures are based on large-block p-CdTe films with resistivity ρ = 10 5 – 10 7 Ω∙сm. The capacitance-voltage, current-voltage, amplitude, and noise characteristics of the structures are measured,...

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Bibliographic Details
Published inRussian physics journal Vol. 55; no. 2; pp. 180 - 185
Main Authors Mirsagatov, Sh. A., Achilov, А. S., Zaveryukhin, B. N., Baiev, М. S.
Format Journal Article
LanguageEnglish
Published Boston Springer US 01.07.2012
Springer
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