Creating a high quality factor negative epsilon photonic material from two level resonant systems

A densely arranged matrix of passive resonant two-level system is analyzed, aiming at a medium with negative macroscopic epsilon with significantly lower losses than current materials. A quality factor is used to compare the proposed material with prevalent current negative epsilon ones. Requirement...

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Bibliographic Details
Published inApplied physics. A, Materials science & processing Vol. 119; no. 1; pp. 33 - 39
Main Author Thylen, Lars
Format Journal Article
LanguageEnglish
Published Berlin/Heidelberg Springer Berlin Heidelberg 01.04.2015
Subjects
Characterization and Evaluation of Materials
Condensed Matter Physics
Invited Paper
Machines
Manufacturing
Nanotechnology
Optical and Electronic Materials
Physics
Physics and Astronomy
Processes
Surfaces and Interfaces
Thin Films
Silicon Photonic
Dipole Moment
Dipole Density
Resonant System
Transversal Relaxation Time
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Summary:A densely arranged matrix of passive resonant two-level system is analyzed, aiming at a medium with negative macroscopic epsilon with significantly lower losses than current materials. A quality factor is used to compare the proposed material with prevalent current negative epsilon ones. Requirements are derived on two-level system parameters in terms of spatial dipole density, dipole moment and transversal relaxation times in order to obtain negative epsilon in the range of −2 to −0 and quality factors more than an order of magnitude larger than currently used materials such as silver.
ISSN:0947-8396
1432-0630
1432-0630
DOI:10.1007/s00339-015-9049-8