Electron-impact excitation of Fe II: Effective collision strengths for optically allowed fine-structure transitions

In this paper, we present collision strengths and Maxwellian averaged effective collision strengths for the electron-impact excitation of Fe II. We consider specifically the optically allowed lines for transitions from the 3d 64s and 3d 7 even parity configuration states to the 3d 64p odd parity con...

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Bibliographic Details
Published inAtomic data and nuclear data tables Vol. 95; no. 6; pp. 910 - 986
Main Author Ramsbottom, C.A.
Format Journal Article
LanguageEnglish
Published United States Elsevier Inc 01.11.2009
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Summary:In this paper, we present collision strengths and Maxwellian averaged effective collision strengths for the electron-impact excitation of Fe II. We consider specifically the optically allowed lines for transitions from the 3d 64s and 3d 7 even parity configuration states to the 3d 64p odd parity configuration levels. The parallel suite of Breit–Pauli codes are utilized to compute the collision cross-sections where relativistic effects are included explicitly in both the target and the scattering approximation. A total of 100 LS or 262- jj levels formed from the basis configurations 3d 64s, 3d 7 and 3d 64p were included in the wavefunction representation of the target, including all doublet, quartet and sextet terms. The Maxwellian averaged effective collision strengths are computed across a wide range of electron temperatures from 100 to 100,000 K, temperatures of importance in astrophysical and plasma applications. A detailed comparison is made with previous works and significant differences were found to occur for some of the transitions considered. We conclude that in order to obtain converged collision strengths and effective collision strengths for these allowed transitions it is necessary to include contributions from partial waves up to L = 50 explicitly in the calculation, and in addition, account for contributions from even higher partial waves through a “top up” procedure.
ISSN:0092-640X
1090-2090
DOI:10.1016/j.adt.2009.08.002