Electron-hole asymmetry in the electron-phonon coupling in top-gated phosphorene transistor
Using in situ Raman scattering from phosphorene channel in an electrochemically top-gated field effect transistor, we show that phonons with Ag symmetry depend much more strongly on concentration of electrons than that of holes, wheras phonons with Bg symmetry are insensitive to doping. With first-p...
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Published in | 2d materials Vol. 3; no. 1; p. 15008 |
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Main Authors | , , , , , , , , |
Format | Journal Article |
Language | English |
Published |
IOP Publishing
18.02.2016
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Subjects | |
Online Access | Get full text |
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Summary: | Using in situ Raman scattering from phosphorene channel in an electrochemically top-gated field effect transistor, we show that phonons with Ag symmetry depend much more strongly on concentration of electrons than that of holes, wheras phonons with Bg symmetry are insensitive to doping. With first-principles theoretical analysis, we show that the observed electon-hole asymmetry arises from the radically different constitution of its conduction and valence bands involving π and bonding states respectively, whose symmetry permits coupling with only the phonons that preserve the lattice symmetry. Thus, Raman spectroscopy is a non-invasive tool for measuring electron concentration in phosphorene-based nanoelectronic devices. |
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Bibliography: | 2DM-100325.R1 ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 23 |
ISSN: | 2053-1583 2053-1583 |
DOI: | 10.1088/2053-1583/3/1/015008 |