The effect of hydrogen dilution on the field emission from hydrogenated amorphous carbon films

• Published in: Solid state communications Vol. 129; no. 8; pp. 497 - 500
• Main Authors: Xu, Jun, Li, Xin, Mei, Jiaxin, Huang, Xiaohui, Li, Zhifeng, Li, Wei, Chen, Kunji
• Format: Journal Article
• Language: English
• Published: Oxford Elsevier Ltd 01.02.2004; Elsevier
• Subjects: A. Thin films; B. Chemical synthesis; Condensed matter: electronic structure, electrical, magnetic, and optical properties; Condensed matter: structure, mechanical and thermal properties; D. Field emission; Electron and ion emission by liquids and solids; impact phenomena; Exact sciences and technology; Field emission, ionization, evaporation, and desorption; Physics; Structure and morphology; thickness; Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties); Thin film structure and morphology; B. Chemical synthesis; 81.16.Be; 85.45.Db; D. Field emission; A. Thin films; 61.43.Dq; Raman spectra; Field emission; Infrared spectra; Low field; Experimental study; Carbon; Thin films; 61.43.Dq A. Thin films; Surface termination; Electronic structure; Electric field effects; Amorphous hydrogenated material; Hydrogen additions; Fourier transform spectra; Microstructure
• ISSN: 0038-1098; 1879-2766
• DOI: 10.1016/j.ssc.2003.11.036

The microstructures and field emission characteristics of hydrogenated amorphous carbon films prepared by using different hydrogen dilution ratio were investigated. It was found that a very low threshold electric field emission could be achieved for samples with moderated hydrogen dilution ratio. However, the field emission characteristics became worse for samples with high hydrogen dilution ratio. The change of field emission can be attributed to the change of electronic structures due to the hydrogen dilution in addition to the increase of the hydrogen surface termination.