An approach for hydrophobic fixed abrasive pad based on layer-by-layer method
Fixed abrasive polishing pad plays an important role in planarization of the surface of integrated circuit and semiconductor substrate. This paper reports a systematic approach for fabricating the pad using polyurethane, metal mold and layer-by-layer curing without binders. The pad surface with unif...
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Published in | Microelectronic engineering Vol. 238; p. 111505 |
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Main Authors | , |
Format | Journal Article |
Language | English |
Published |
Amsterdam
Elsevier B.V
01.02.2021
Elsevier BV |
Subjects | |
Online Access | Get full text |
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Summary: | Fixed abrasive polishing pad plays an important role in planarization of the surface of integrated circuit and semiconductor substrate. This paper reports a systematic approach for fabricating the pad using polyurethane, metal mold and layer-by-layer curing without binders. The pad surface with uniformly and orderly arranged convexities is undamaged during the fabrication process. Because of using prepolymer with hydrophobic groups, self-conditioning, stable polishing process and no water swelling are observed during the polishing process. The experimental results show the material removal rate is 72.972 nm/min and the polished surface roughness is 0.007 μm for SiC wafer. It builds a basis for high efficient preparation technology on hydrophobic fixed abrasive pad.
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•Appropriate proportion of hydrophobic prepolymer, active diluents, photo initiator, additives and abrasive particles is proposed to fabricate FA-CMP pad.•The connection between pad layers is firm without binder and water swelling performance is prevented.•The prepared FA-CMP pad has self-conditioning and stable performance during polishing.•This is a simple and general process which is proven as an easy and environment-friendly way for high efficient preparation technology on hydrophobic fixed abrasive pad. |
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ISSN: | 0167-9317 1873-5568 |
DOI: | 10.1016/j.mee.2021.111505 |