Method of excess fractions with application to absolute distance metrology: wavelength selection and the effects of common error sources
Multiwavelength interferometry (MWI) is a well established technique in the field of optical metrology. Previously, we have reported a theoretical analysis of the method of excess fractions that describes the mutual dependence of unambiguous measurement range, reliability, and the measurement wavele...
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| Published in | Applied optics. Optical technology and biomedical optics Vol. 51; no. 27; p. 6471 |
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| Main Authors | , , |
| Format | Journal Article |
| Language | English |
| Published |
United States
20.09.2012
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| Online Access | Get more information |
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| Summary: | Multiwavelength interferometry (MWI) is a well established technique in the field of optical metrology. Previously, we have reported a theoretical analysis of the method of excess fractions that describes the mutual dependence of unambiguous measurement range, reliability, and the measurement wavelengths. In this paper wavelength, selection strategies are introduced that are built on the theoretical description and maximize the reliability in the calculated fringe order for a given measurement range, number of wavelengths, and level of phase noise. Practical implementation issues for an MWI interferometer are analyzed theoretically. It is shown that dispersion compensation is best implemented by use of reference measurements around absolute zero in the interferometer. Furthermore, the effects of wavelength uncertainty allow the ultimate performance of an MWI interferometer to be estimated. |
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| ISSN: | 2155-3165 |
| DOI: | 10.1364/AO.51.006471 |