Spectral characterization of nanostructured birefringent porous silicon
We present measurements and analysis of the reflection spectrum of white light from a highly birefringent porous silicon layer at different polarization states. We report an anomalous pattern in the spectrum of linearly polarized light at 45° with respect to the principal axes of the layer. This spe...
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| Published in | Applied optics. Optical technology and biomedical optics Vol. 54; no. 36; p. 10636 |
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| Main Authors | , , , |
| Format | Journal Article |
| Language | English |
| Published |
United States
20.12.2015
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| Online Access | Get more information |
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| Summary: | We present measurements and analysis of the reflection spectrum of white light from a highly birefringent porous silicon layer at different polarization states. We report an anomalous pattern in the spectrum of linearly polarized light at 45° with respect to the principal axes of the layer. This spectrum comprises a combination of two interference effects, namely the Fabry-Perot-type multiple-beam interference present in a simple thin film, and a two-wave interference caused by the beat of two combined orthogonally polarized waves propagating in the birefringent medium. We perform a Fourier analysis of the measured reflected spectra. This analysis furnishes a powerful tool in order to separate the two interference mechanisms and determine the degree of coherence of their superposition. |
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| ISSN: | 2155-3165 |
| DOI: | 10.1364/AO.54.010636 |