Measurement of Temperature-Dependent Relaxation Oscillation Frequency and Linewidth Enhancement Factor of a 1550 nm VCSEL

• Published in: IEEE journal of quantum electronics Vol. 49; no. 11; pp. 990 - 996
• Main Authors: Khan, Nadir Ali, Schires, Kevin, Hurtado, Antonio, Henning, Ian D., Adams, Michael J.
• Format: Journal Article
• Language: English
• Published: New York IEEE 01.11.2013; The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
• Subjects: Current measurement; Frequency measurement; Linewidth enhancement factor; Optical polarization; Polarization; Quantum electronics; relaxation oscillation frequency (ROF); Relaxation oscillations; semiconductor lasers; Temperature distribution; Temperature measurement; Vertical cavity surface emission lasers; Vertical cavity surface emitting lasers; vertical-cavity surface-emitting lasers (VCSELs); Wavelengths

In this paper, we present detailed measurements of the temperature-dependent relaxation oscillation frequency and polarization resolved linewidth enhancement factor (α) of a 1550-nm vertical cavity surface emitting laser (VCSEL). The thermal effects on these parameters are investigated for a tempera...