Measurement of Temperature-Dependent Relaxation Oscillation Frequency and Linewidth Enhancement Factor of a 1550 nm VCSEL

In this paper, we present detailed measurements of the temperature-dependent relaxation oscillation frequency and polarization resolved linewidth enhancement factor (α) of a 1550-nm vertical cavity surface emitting laser (VCSEL). The thermal effects on these parameters are investigated for a tempera...

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Bibliographic Details
Published inIEEE journal of quantum electronics Vol. 49; no. 11; pp. 990 - 996
Main Authors Khan, Nadir Ali, Schires, Kevin, Hurtado, Antonio, Henning, Ian D., Adams, Michael J.
Format Journal Article
LanguageEnglish
Published New York IEEE 01.11.2013
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subjects
Current measurement
Frequency measurement
Linewidth enhancement factor
Optical polarization
Polarization
Quantum electronics
relaxation oscillation frequency (ROF)
Relaxation oscillations
semiconductor lasers
Temperature distribution
Temperature measurement
Vertical cavity surface emission lasers
Vertical cavity surface emitting lasers
vertical-cavity surface-emitting lasers (VCSELs)
Wavelengths
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Summary:In this paper, we present detailed measurements of the temperature-dependent relaxation oscillation frequency and polarization resolved linewidth enhancement factor (α) of a 1550-nm vertical cavity surface emitting laser (VCSEL). The thermal effects on these parameters are investigated for a temperature range of -20°C to 60°C. Comparison is made between the experimental observations and theoretical predictions for similar VCSELs and with those different in operating wavelength and/or materials.
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ISSN:0018-9197
1558-1713
DOI:10.1109/JQE.2013.2282759