Measurement of Temperature-Dependent Relaxation Oscillation Frequency and Linewidth Enhancement Factor of a 1550 nm VCSEL

In this paper, we present detailed measurements of the temperature-dependent relaxation oscillation frequency and polarization resolved linewidth enhancement factor (α) of a 1550-nm vertical cavity surface emitting laser (VCSEL). The thermal effects on these parameters are investigated for a tempera...

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Published inIEEE journal of quantum electronics Vol. 49; no. 11; pp. 990 - 996
Main Authors Khan, Nadir Ali, Schires, Kevin, Hurtado, Antonio, Henning, Ian D., Adams, Michael J.
Format Journal Article
LanguageEnglish
Published New York IEEE 01.11.2013
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subjects
Current measurement
Frequency measurement
Linewidth enhancement factor
Optical polarization
Polarization
Quantum electronics
relaxation oscillation frequency (ROF)
Relaxation oscillations
semiconductor lasers
Temperature distribution
Temperature measurement
Vertical cavity surface emission lasers
Vertical cavity surface emitting lasers
vertical-cavity surface-emitting lasers (VCSELs)
Wavelengths
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Abstract In this paper, we present detailed measurements of the temperature-dependent relaxation oscillation frequency and polarization resolved linewidth enhancement factor (α) of a 1550-nm vertical cavity surface emitting laser (VCSEL). The thermal effects on these parameters are investigated for a temperature range of -20°C to 60°C. Comparison is made between the experimental observations and theoretical predictions for similar VCSELs and with those different in operating wavelength and/or materials.
AbstractList In this paper, we present detailed measurements of the temperature-dependent relaxation oscillation frequency and polarization resolved linewidth enhancement factor [Formula Omitted] of a 1550-nm vertical cavity surface emitting laser (VCSEL). The thermal effects on these parameters are investigated for a temperature range of [Formula Omitted] to 60[Formula Omitted]. Comparison is made between the experimental observations and theoretical predictions for similar VCSELs and with those different in operating wavelength and/or materials.
In this paper, we present detailed measurements of the temperature-dependent relaxation oscillation frequency and polarization resolved linewidth enhancement factor (α) of a 1550-nm vertical cavity surface emitting laser (VCSEL). The thermal effects on these parameters are investigated for a temperature range of -20°C to 60°C. Comparison is made between the experimental observations and theoretical predictions for similar VCSELs and with those different in operating wavelength and/or materials.
In this paper, we present detailed measurements of the temperature-dependent relaxation oscillation frequency and polarization resolved linewidth enhancement factor ( alpha ) of a 1550-nm vertical cavity surface emitting laser (VCSEL). The thermal effects on these parameters are investigated for a temperature range of - rm 20 [compfn] rm C to 60 [compfn] rm C . Comparison is made between the experimental observations and theoretical predictions for similar VCSELs and with those different in operating wavelength and/or materials.
Author Adams, Michael J.
Schires, Kevin
Hurtado, Antonio
Khan, Nadir Ali
Henning, Ian D.
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Cites_doi 10.1063/1.93894
10.1049/el:20073633
10.1016/S0030-4018(98)00295-8
10.1143/JJAP.45.L8
10.1109/LPT.2005.844560
10.1109/LPT.2008.926564
10.1109/JQE.2004.840450
10.1109/JQE.2004.826421
10.1117/12.208441
10.1109/3.631290
10.1103/PhysRevA.71.063801
10.1049/el:19850470
10.1063/1.108731
10.1109/JQE.2006.881828
10.1109/JQE.1985.1072760
10.1109/MWSYM.1989.38931
10.1109/JSTQE.2009.2013359
10.1109/JQE.2012.2191141
10.1109/JQE.2003.823018
10.1109/JQE.2006.884583
10.1109/3.853556
10.1117/12.921991
10.1016/S0030-4018(96)00705-5
10.1109/JSTQE.2009.2015465
10.1109/JLT.2006.889362
10.1109/3.7119
10.1109/68.393190
10.1063/1.108947
10.1109/LEOS.1994.587001
10.1016/S0030-4018(02)02192-2
10.1109/50.495166
10.1063/1.121318
10.1364/OE.14.002950
10.1109/JLT.2005.860156
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References ref35
ref13
ref34
ref12
ref15
ref14
ref31
ref30
ref33
ref11
ref32
ref10
ref2
ref1
ref17
ref16
ref19
ref18
ref23
ref26
ref25
ref20
ref22
ref21
coldren (ref24) 1995
ref28
ref27
ref29
ref8
ref7
ref9
ref4
ref3
ref6
ref5
References_xml – ident: ref18
  doi: 10.1063/1.93894
– ident: ref34
  doi: 10.1049/el:20073633
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  doi: 10.1016/S0030-4018(98)00295-8
– ident: ref14
  doi: 10.1143/JJAP.45.L8
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  doi: 10.1109/LPT.2005.844560
– ident: ref1
  doi: 10.1109/LPT.2008.926564
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  doi: 10.1109/JQE.2004.840450
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  doi: 10.1109/JQE.2004.826421
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  doi: 10.1117/12.208441
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  doi: 10.1109/3.631290
– ident: ref29
  doi: 10.1103/PhysRevA.71.063801
– ident: ref19
  doi: 10.1049/el:19850470
– ident: ref23
  doi: 10.1063/1.108731
– ident: ref9
  doi: 10.1109/JQE.2006.881828
– ident: ref32
  doi: 10.1109/JQE.1985.1072760
– ident: ref20
  doi: 10.1109/MWSYM.1989.38931
– ident: ref2
  doi: 10.1109/JSTQE.2009.2013359
– ident: ref13
  doi: 10.1109/JQE.2012.2191141
– ident: ref27
  doi: 10.1109/JQE.2003.823018
– ident: ref25
  doi: 10.1109/JQE.2006.884583
– ident: ref30
  doi: 10.1109/3.853556
– ident: ref35
  doi: 10.1117/12.921991
– year: 1995
  ident: ref24
  publication-title: Diode Lasers and Photonic Integrated Circuits
– ident: ref31
  doi: 10.1016/S0030-4018(96)00705-5
– ident: ref3
  doi: 10.1109/JSTQE.2009.2015465
– ident: ref22
  doi: 10.1109/JLT.2006.889362
– ident: ref26
  doi: 10.1109/3.7119
– ident: ref28
  doi: 10.1109/68.393190
– ident: ref15
  doi: 10.1063/1.108947
– ident: ref17
  doi: 10.1109/LEOS.1994.587001
– ident: ref21
  doi: 10.1016/S0030-4018(02)02192-2
– ident: ref16
  doi: 10.1109/50.495166
– ident: ref7
  doi: 10.1063/1.121318
– ident: ref33
  doi: 10.1364/OE.14.002950
– ident: ref4
  doi: 10.1109/JLT.2005.860156
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SubjectTerms Current measurement
Frequency measurement
Linewidth enhancement factor
Optical polarization
Polarization
Quantum electronics
relaxation oscillation frequency (ROF)
Relaxation oscillations
semiconductor lasers
Temperature distribution
Temperature measurement
Vertical cavity surface emission lasers
Vertical cavity surface emitting lasers
vertical-cavity surface-emitting lasers (VCSELs)
Wavelengths
Title Measurement of Temperature-Dependent Relaxation Oscillation Frequency and Linewidth Enhancement Factor of a 1550 nm VCSEL
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