Measuring the Residual Phase Noise of Photodiodes Using Two-Tone Correlation Method

In this letter, we propose a novel approach to measure the residual phase noise (RPN) of a photodiode (PD) using two-tone correlation method. Based on this method, the phase noises of the microwave sources and noise contributions from other components in different paths are suppressed mostly because...

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Bibliographic Details
Published inIEEE photonics technology letters Vol. 26; no. 22; pp. 2264 - 2266
Main Authors Dezhao, Zhu, Chun, Yang, Zhewei, Cao, Xianghua, Li
Format Journal Article
LanguageEnglish
Published New York IEEE 15.11.2014
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subjects
Compressing
Compression tests
Correlation analysis
Microwave theory and techniques
Microwaves
Noise
Noise levels
Nonlinearity
Optical saturation
Optical variables measurement
Phase measurement
Phase noise
Photodiodes
Radio frequency
photodiode
two-tone
correlation
Residual phase noise
nonlinearity
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Summary:In this letter, we propose a novel approach to measure the residual phase noise (RPN) of a photodiode (PD) using two-tone correlation method. Based on this method, the phase noises of the microwave sources and noise contributions from other components in different paths are suppressed mostly because they are all uncorrelated while the RPN of the PD is preserved. We have measured the RPNs of the PD with different incident optical power to find out the relationship between the RPN and RF tone compression due to the nonlinearity of the PD. The RPN varies significantly along with the increase of RF compression. The RPN jumps up by 15 dB when the RF compression is 1.9 dB compared with 0.2 dB.
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ISSN:1041-1135
1941-0174
DOI:10.1109/LPT.2014.2354518