Event-Triggered Adaptive Antidisturbance Switching Control for Switched Systems With Dynamic Neural Network Disturbance Modeling
In this article, a dynamic event-triggered adaptive antidisturbance (ETAAD) switching control strategy is proposed for switched systems subject to multisource disturbances. The disturbances are divided into two categories: the available unmodeled disturbance and the unavailable dynamic neural networ...
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Published in | IEEE transaction on neural networks and learning systems Vol. 35; no. 12; pp. 17688 - 17700 |
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Main Authors | , , , , |
Format | Journal Article |
Language | English |
Published |
United States
IEEE
01.12.2024
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Subjects | |
Online Access | Get full text |
ISSN | 2162-237X 2162-2388 2162-2388 |
DOI | 10.1109/TNNLS.2023.3307389 |
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Summary: | In this article, a dynamic event-triggered adaptive antidisturbance (ETAAD) switching control strategy is proposed for switched systems subject to multisource disturbances. The disturbances are divided into two categories: the available unmodeled disturbance and the unavailable dynamic neural network modeled disturbance. First, a dynamic ET criterion is set based on the system state. Then, a novel dynamic ETA disturbance estimator is introduced to observe the modeled disturbance. Furthermore, according to the ET rule and adaptive disturbance observer, a switched controller is designed. Next, under the controller and switching criterion with the average dwell time limitation, sufficient conditions are given to force the switched systems to realize multisource disturbance suppression (DS), trajectory tracking, and communication resource (CR) saving simultaneously. Meanwhile, the Zeno phenomenon may be caused by the ET rule being excluded. In addition, the presented ETAAD approach is also applicable to the nonswitched systems case. Finally, a simulation case is given to validate the effectiveness of the dynamic ETAAD switching control method. |
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Bibliography: | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 23 |
ISSN: | 2162-237X 2162-2388 2162-2388 |
DOI: | 10.1109/TNNLS.2023.3307389 |