Wall-Voltage Stability in AC-PDP Dielectric Barrier Discharges

The wall-voltage loss in PDPs with four different types of protective layers, i.e., undoped MgO, Si-doped MgO, Sc-doped MgO, and MgCaO (15%) plasma, are compared. Using a two-electrode opposed-discharge-type PDP, the change in external panel voltage needed to get a new discharge is measured as a fun...

Full description

Saved in:
Bibliographic Details
Published inIEEE transactions on plasma science Vol. 41; no. 1; pp. 159 - 164
Main Authors Yuxiang Chen, Qing Li, Kai Hu, Wenjian Kuang, Tolner, Harm
Format Journal Article
LanguageEnglish
Published New York IEEE 01.01.2013
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subjects
Amplification
Comparative analysis
Dielectric barrier
Dielectric relaxation
dielectric-plasma interaction
Dielectrics
Discharges (electric)
Electric potential
Electrodes
Electronics
exoemission
Loss measurement
low-temperature plasma
Magnesium oxide
neon xenon
Partial discharges
Semiconductor doping
Stability
Syntax
Voltage
Voltage measurement
wall voltage
Xenon
Online AccessGet full text

Cover

More Information
Summary:The wall-voltage loss in PDPs with four different types of protective layers, i.e., undoped MgO, Si-doped MgO, Sc-doped MgO, and MgCaO (15%) plasma, are compared. Using a two-electrode opposed-discharge-type PDP, the change in external panel voltage needed to get a new discharge is measured as a function of the waiting time from 5 μs to 50 ms, the number of sustain cycles (1-1024), and the sustain frequency. The results shows that the wall-voltage loss cannot only be caused by amplified exoemission but that dielectric relaxation effects might also play an important role.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
ISSN:0093-3813
1939-9375
DOI:10.1109/TPS.2012.2227829