Possible Radiation-Induced Damage to the Molecular Structure of Wooden Artifacts Due to Micro-Computed Tomography, Handheld X-Ray Fluorescence, and X-Ray Photoelectron Spectroscopic Techniques

This study was undertaken to ascertain whether radiation produced by X-ray photoelectron spectroscopy (XPS), micro-computed tomography ([mu]CT) and/or portable handheld X-ray fluorescence (XRF) equipment might damage wood artifacts during analysis. Changes at the molecular level were monitored by Fo...

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Bibliographic Details
Published inJournal of conservation & museum studies Vol. 14; no. 1
Main Authors Kozachuk, Madalena, Suda, Alexandra, Ellis, Lisa, Walzak, Mary, Biesinger, Mark, Macfie, Sheila, Hudson, Robert, Nelson, Andrew, Ma, Heginbotham, Arlen
Format Journal Article
LanguageEnglish
Published Ubiquity Press Ltd 20.05.2016
Ubiquity Press
Subjects
Boxwood
Damage
Fatigue (Materials)
FTIR
Ionizing radiation
Materials research
Properties
Wooden Artifacts
X-ray Analysis
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Summary:This study was undertaken to ascertain whether radiation produced by X-ray photoelectron spectroscopy (XPS), micro-computed tomography ([mu]CT) and/or portable handheld X-ray fluorescence (XRF) equipment might damage wood artifacts during analysis. Changes at the molecular level were monitored by Fourier transform infrared (FTIR) analysis. No significant changes in FTIR spectra were observed as a result of [mu]CT or handheld XRF analysis. No substantial changes in the collected FTIR spectra were observed when XPS analytical times on the order of minutes were used. However, XPS analysis collected over tens of hours did produce significant changes in the FTIR spectra. Keywords: X-ray Analysis, FTIR, Wooden Artifacts, Damage
ISSN:1364-0429
2049-4572
1364-0429
DOI:10.5334/jcms.126