Passivation mechanism and long-term stability: Insights from SEM-EDS analysis of passivated CdZnTeSe crystal

• Published in: Nuclear engineering and technology Vol. 56; no. 10; pp. 4455 - 4462
• Main Authors: Seo, Jiwon, Byun, Jangwon, Kim, Kihyun, Kim, Younghak, Kim, Yonghoon, Park, Beomjun
• Format: Journal Article
• Language: English
• Published: Elsevier B.V 01.10.2024; Elsevier; 한국원자력학회
• Subjects: CdZnTeSe; Passivation; Radiation detector; SEM-EDS; Sodium hypochlorite; 원자력공학; Sodium hypochlorite; Radiation detector; SEM-EDS; CdZnTeSe; Passivation
• ISSN: 1738-5733; 2234-358X
• DOI: 10.1016/j.net.2024.06.007

This study investigates the efficient passivation of CdTe-based semiconductor crystals, focusing on the long-term stability and underlying mechanisms of NaOCl passivation. CdZnTeSe crystals were grown, processed, and passivated with NaOCl, and their surface characteristics were studied using SEM-EDS and XPS. The passivation was found to significantly enhance the surface resistance, with a sustained effect for more than 90 s, attributed to the formation of a tellurium oxide layer. The passivation process was further elucidated through detailed morphological and compositional analyses. The NaOCl-passivated crystals exhibited improved electrical and spectroscopic properties in radiation detection, with a prolonged stability of 60–90 days, which are longer compared to other passivants. Additionally, the feasibility of NaOCl passivation on a CdZnTeSe detector was explored, showcasing enhanced material resistance and spectroscopic performance. The study concludes with insights into the potential industrial application of NaOCl passivation for CdTe-based radiation detectors.