Microstructural Evolution With the Change in Thickness of Superconducting Films

Microstructural evolution with the change in thickness of superconducting YBa 2 Cu 3 O 7-X films on single-crystal SrTiO 3 substrates deposited by pulsed laser deposition was evaluated using different structural characterization tools. A noticeable degradation of crystallinity with the increased fil...

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Bibliographic Details
Published inIEEE transactions on applied superconductivity Vol. 17; no. 2; pp. 3243 - 3246
Main Authors Jia, Q.X., Wang, H., Lin, Y., Li, Y., Wetteland, C., Brown, G.W., Hawley, M., Maiorov, B., Foltyn, S.R., Civale, L., Arendt, P.N., MacManus-Driscoll, J.L.
Format Journal Article
LanguageEnglish
Published New York IEEE 01.06.2007
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subjects
Conductors
COPPER OXIDE
Crystal microstructure
Crystallinity
Crystallization
Degradation
DEPOSITION
Evolution
Film thickness
High temperature superconductors
Magnetic films
Microstructure
MICROSTRUCTURES
Optical pulses
Pulsed laser deposition
Substrates
Superconducting films
SUPERCONDUCTIVITY
thick films
thin films
X-ray diffraction
Yttrium barium copper oxide
YTTRIUM OXIDE
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Summary:Microstructural evolution with the change in thickness of superconducting YBa 2 Cu 3 O 7-X films on single-crystal SrTiO 3 substrates deposited by pulsed laser deposition was evaluated using different structural characterization tools. A noticeable degradation of crystallinity with the increased film thickness was detected. Nevertheless, a comprehensive relationship between the microstructure and the zero-field current-density can not be established solely based on the degradation of crystallinity.
Bibliography:ObjectType-Article-1
SourceType-Scholarly Journals-1
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ISSN:1051-8223
1558-2515
DOI:10.1109/TASC.2007.898941