In-situ decomposition and etching of AlN and GaN in the presence of HCl
The etch rates of gaseous HCl on AlN and GaN in H2 ambient in a MOVPE reactor have been studied. For AlN, etching by HCl in H2 and N2 is compared. When etching GaN in hydrogen by HCl, a dependency of etch rate on temperature was found and the activation energy was determined. We propose a two-step r...
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Published in | Journal of crystal growth Vol. 393; pp. 89 - 92 |
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Main Authors | , , , , , |
Format | Journal Article Conference Proceeding |
Language | English |
Published |
Amsterdam
Elsevier B.V
01.05.2014
Elsevier |
Subjects | |
Online Access | Get full text |
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Summary: | The etch rates of gaseous HCl on AlN and GaN in H2 ambient in a MOVPE reactor have been studied. For AlN, etching by HCl in H2 and N2 is compared. When etching GaN in hydrogen by HCl, a dependency of etch rate on temperature was found and the activation energy was determined. We propose a two-step reaction in which the first step, the decomposition of GaN, is the limiting one. The second step consists of a reaction of Ga with HCl to form volatile GaCl. We noticed that the decomposition step is enhanced with increased hydrogen partial pressure. Further, we observed that a coverage of the surface with Ga enhances the decomposition rate. By using a pulsed supply of HCl into the reactor a Ga-rich surface was maintained and the etch rate enhanced up to a temperature of 830°C.
•Systematic study on etch rates of gaseous HCl on AlN and GaN in a MOVPE reactor•For etching GaN in H2 by HCl the activation energy determined.•A coverage of the GaN surface with Ga enhances the etch rate.•A pulsed supply of HCl enhances the etch rate up to a temperature of 830°C. |
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Bibliography: | ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 ObjectType-Article-1 ObjectType-Feature-2 |
ISSN: | 0022-0248 1873-5002 |
DOI: | 10.1016/j.jcrysgro.2013.09.025 |