An Approach to Locate Parametric Faults in Nonlinear Analog Circuits

Aiming at the problem to locate parametric faults in nonlinear analog circuits, a new approach based on the subband decomposition combined with coherence functions is proposed. First, the Volterra series of the circuit under test decomposed by wavelet packets are used to detect the parametric faults...

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Bibliographic Details
Published inIEEE transactions on instrumentation and measurement Vol. 61; no. 2; pp. 358 - 367
Main Authors Deng, Yong, Shi, Yibing, Zhang, Wei
Format Journal Article
LanguageEnglish
Published New York IEEE 01.02.2012
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subjects
Analog circuits
Circuit faults
Circuits
Coherence
Coherence function
Decomposition
Fault diagnosis
Faults
Instrumentation
Integrated circuit modeling
Kernel
Mathematical analysis
Nonlinear circuits
Nonlinearity
parametric faults
Volterra series
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Summary:Aiming at the problem to locate parametric faults in nonlinear analog circuits, a new approach based on the subband decomposition combined with coherence functions is proposed. First, the Volterra series of the circuit under test decomposed by wavelet packets are used to detect the parametric faults. Then, the Volterra series in subbands are used to calculate the coherence functions. By comparison with the fault signatures, different states of the parametric faulty circuits are identified, and the faults are located. Simulations show the effectiveness of the method of the fault diagnosis in nonlinear circuits.
Bibliography:ObjectType-Article-1
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ISSN:0018-9456
1557-9662
DOI:10.1109/TIM.2011.2161930