Extended X-ray absorption fine structure studies of luminescent centers in II-VI thin films

EXAFS was used to determine local structure of luminescence centers in doped sulfide thin films for electroluminescent displays. Tb sup 3 sup + forms polycations of TbO sup + in ZnS. Sputtered ZnS films had strong structural disorder relative to atomic layer epitaxial films.

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Bibliographic Details
Published inJournal of the Electrochemical Society Vol. 140; no. 7; pp. 2015 - 2019
Main Authors CHARREIRE, Y, SVORONOS, D.-R, ASCONE, I, TOLONEN, O, NIINISTÖ, L, LESKELÄ, M
Format Journal Article
LanguageEnglish
Published Pennington, NJ Electrochemical Society 01.07.1993
Subjects
Condensed matter: structure, mechanical and thermal properties
Exact sciences and technology
Physical properties of thin films, nonelectronic
Physics
Solid surfaces and solid-solid interfaces
Surface energy; thermodynamic properties
Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)
Atomic layer method
Bond length
II-VI compound
Coordination
Transition metal Compounds
Doping
Cerium
Electroluminescence
Luminescent material
Experimental study
Calcium Sulfides
EXAFS spectrometry
Thin film
Thulium
Local structure
Electroluminescent device
Radial distribution function
Terbium
Strontium Sulfides
Zinc Sulfides
Manganese
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Summary:EXAFS was used to determine local structure of luminescence centers in doped sulfide thin films for electroluminescent displays. Tb sup 3 sup + forms polycations of TbO sup + in ZnS. Sputtered ZnS films had strong structural disorder relative to atomic layer epitaxial films.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
ISSN:0013-4651
1945-7111
DOI:10.1149/1.2220754