Empirical Analysis of Rank Aggregation-Based Multi-Filter Feature Selection Methods in Software Defect Prediction

Selecting the most suitable filter method that will produce a subset of features with the best performance remains an open problem that is known as filter rank selection problem. A viable solution to this problem is to independently apply a mixture of filter methods and evaluate the results. This st...

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Published inElectronics (Basel) Vol. 10; no. 2; p. 179
Main Authors Balogun, Abdullateef O., Basri, Shuib, Mahamad, Saipunidzam, Abdulkadir, Said Jadid, Capretz, Luiz Fernando, Imam, Abdullahi A., Almomani, Malek A., Adeyemo, Victor E., Kumar, Ganesh
Format Journal Article
LanguageEnglish
Published Basel MDPI AG 01.01.2021
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Summary:Selecting the most suitable filter method that will produce a subset of features with the best performance remains an open problem that is known as filter rank selection problem. A viable solution to this problem is to independently apply a mixture of filter methods and evaluate the results. This study proposes novel rank aggregation-based multi-filter feature selection (FS) methods to address high dimensionality and filter rank selection problem in software defect prediction (SDP). The proposed methods combine rank lists generated by individual filter methods using rank aggregation mechanisms into a single aggregated rank list. The proposed methods aim to resolve the filter selection problem by using multiple filter methods of diverse computational characteristics to produce a dis-joint and complete feature rank list superior to individual filter rank methods. The effectiveness of the proposed method was evaluated with Decision Tree (DT) and Naïve Bayes (NB) models on defect datasets from NASA repository. From the experimental results, the proposed methods had a superior impact (positive) on prediction performances of NB and DT models than other experimented FS methods. This makes the combination of filter rank methods a viable solution to filter rank selection problem and enhancement of prediction models in SDP.
ISSN:2079-9292
2079-9292
DOI:10.3390/electronics10020179