YOLOv3_ReSAM: A Small-Target Detection Method
Small targets in long-distance aerial photography have the problems of small size and blurry appearance, and traditional object detection algorithms face great challenges in the field of small-object detection. With the collection of massive data in the information age, traditional object detection...
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Published in | Electronics (Basel) Vol. 11; no. 10; p. 1635 |
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Main Authors | , , , |
Format | Journal Article |
Language | English |
Published |
Basel
MDPI AG
01.05.2022
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Subjects | |
Online Access | Get full text |
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Summary: | Small targets in long-distance aerial photography have the problems of small size and blurry appearance, and traditional object detection algorithms face great challenges in the field of small-object detection. With the collection of massive data in the information age, traditional object detection algorithms have been gradually replaced by deep learning algorithms and have an advantage. In this paper, the YOLOV3-Tiny backbone network is augmented by using the pyramid structure of image features to achieve multi-level feature fusion prediction. In order to eliminate the loss of spatial feature information and hierarchical information caused by pooling operations in convolution processes and multi-scale operations in multi-layer structures, a spatial attention mechanism based on residual structure is proposed. At the same time, the idea of reinforcement learning is introduced to guide bounding box regression on the basis of the rough positioning of the native boundary regression strategy, and the variable IoU calculation method is used as the evaluation index of the reward function, and the boundary regression model based on the reward mechanism is proposed for fine adjustment. The VisDrone2019 data set was selected as the experimental data support. Experimental results show that the mAP value of the improved small-object detection model is 33.15%, which is 11.07% higher than that of the native network model, and the boundary regression accuracy is improved by 23.74%. |
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ISSN: | 2079-9292 2079-9292 |
DOI: | 10.3390/electronics11101635 |