Electrical Contact Resistance of Multi-Contact Connector in Semi-Retractable Current Lead

• Published in: IEEE transactions on applied superconductivity Vol. 21; no. 3; pp. 1050 - 1053
• Main Authors: Choi, Yeon Suk, Kim, Dong Lak, Kim, Myung Su
• Format: Journal Article Conference Proceeding
• Language: English
• Published: New York, NY IEEE 01.06.2011; Institute of Electrical and Electronics Engineers; The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
• Subjects: Applied sciences; Capacitors. Resistors. Filters; Connectors; Contacts; Current lead; electrical contact resistance; Electrical engineering. Electrical power engineering; Electromagnets; Electronic equipment and fabrication. Passive components, printed wiring boards, connectics; Electronics; Exact sciences and technology; Interfaces; Lead; Resistance; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices; superconducting magnet; Superconducting magnets; Temperature; Temperature measurement; Various equipment and components; electrical contact resistance; Magnet; Contact resistance; Electric contact; Cryogenic temperature; Superconducting magnet; Electrical connector; Cryogenics; High field; Electric resistivity; Leakage current; Feasibility; Electrical conductor; Resistor; High temperature superconductor; Current lead
• ISSN: 1051-8223; 1558-2515
• DOI: 10.1109/TASC.2010.2103353

Heat leakage through current leads is the dominant contributor to cryogenic heat load for various high field magnets. The semi-retractable current lead is a good option because the conductive heat leak can be eliminated after the magnet is charged. It is composed of a normal metal element and an HTS element. The normal metal element is disengaged from the HTS element through the multi-contact connector without disturbance to the insulating vacuum space and without requiring complete removal of the normal metal element. In this paper, the electrical contact resistance of multi-contact connector is measured to confirm the feasibility of our application. The effects of current level, operating temperature and size on the electrical contact resistance in a lockable set are also discussed.