Density profile unfolding from Compton scattering measurements in reflection geometry

In this article, we report a mathematical procedure that allows the unfolding of the density profile from the measurement of an integrated scattering signal containing predominantly the Compton component. An experimental device (patent claimed) has been used for the measurements. It uses a radiation...

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Bibliographic Details
Published inX-ray spectrometry Vol. 36; no. 1; pp. 20 - 26
Main Authors Fernández, Jorge E., Badiali, Marco, Guidetti, Alessandro, Scot, Viviana
Format Journal Article Conference Proceeding
LanguageEnglish
Published Chichester, UK John Wiley & Sons, Ltd 01.01.2007
Wiley
Subjects
Analytical chemistry
Chemistry
Exact sciences and technology
Radiation source
Light element
Algorithm
Compton effect
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Summary:In this article, we report a mathematical procedure that allows the unfolding of the density profile from the measurement of an integrated scattering signal containing predominantly the Compton component. An experimental device (patent claimed) has been used for the measurements. It uses a radiation source with white x‐ray spectrum (unpolarized) and the reflection geometry to maximize the Compton signal. The algorithm has been tested on light‐element, inhomogeneous samples of uniform and non‐uniform densities. Incomplete primary volume and multiple scattering corrections are also discussed. The resulting density profiles are in good agreement with direct measurements of profiles performed with other means. Copyright © 2006 John Wiley & Sons, Ltd.
Bibliography:ark:/67375/WNG-M5P1MCL1-W
Paper presented as part of a Special Issue of papers from the 2006 European X-ray Spectrometry Conference, Paris, France, 19-23 June. Part 1.
istex:DC8427D9758F5C64AA20278DD8582629F332351C
ArticleID:XRS932
Paper presented as part of a Special Issue of papers from the 2006 European X‐ray Spectrometry Conference, Paris, France, 19–23 June. Part 1.
ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
ISSN:0049-8246
1097-4539
DOI:10.1002/xrs.932