Interelement effects in X-ray fluorescence determination of the surface density of vanadium nanofilms on various substrates

This paper presents a detailed study of the effect of the fluorescence of bulk substrates on the fluorescence intensity of vanadium nanofilms of various thicknesses and examines vanadium K α fluorescence enhancement by emission from the substrate. We calculate correction coefficients that take into...

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Bibliographic Details
Published inInorganic materials Vol. 49; no. 12; pp. 1194 - 1198
Main Authors Mashin, N. I., Chernyaeva, E. A., Tumanova, A. N., Ershov, A. A.
Format Journal Article
LanguageEnglish
Published Boston Springer US 01.12.2013
Subjects
Chemistry
Chemistry and Materials Science
Density
Fluorescence
Industrial Chemistry/Chemical Engineering
Inorganic Chemistry
Materials Science
Mathematical analysis
Nanocomposites
Nanomaterials
Nanostructure
Vanadium
X-ray fluorescence
Bulk Substrate
Mass Attenuation Coefficient
Vanadium
Polycrystalline Alumina
Surface Density
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Summary:This paper presents a detailed study of the effect of the fluorescence of bulk substrates on the fluorescence intensity of vanadium nanofilms of various thicknesses and examines vanadium K α fluorescence enhancement by emission from the substrate. We calculate correction coefficients that take into account film-substrate interelement effects and demonstrate that it is appropriate to use unified auxiliary systems in analysis of real nanofilm structures.
Bibliography:ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 23
ISSN:0020-1685
1608-3172
DOI:10.1134/S002016851312011X