The effects of sodium in ITO by pulsed laser deposition on organic light-emitting diodes

The depth profile of ITO on glass was measured by the time-of-flight secondary ion mass spectroscopy (TOFSIMS) which revealed high sodium (Na) ion concentration at the ITO surface as well as at the ITO–glass interface as a result of out diffusion with substrate heating. Effects of Na ions on the per...

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Published inApplied physics. A, Materials science & processing Vol. 101; no. 4; pp. 621 - 626
Main Authors Yong, Thian-Khok, Kee, Yeh-Yee, Tan, Sek-Sean, Yap, Seong-Shan, Siew, Wee-Ong, Tou, Teck-Yong
Format Journal Article
LanguageEnglish
Published Berlin/Heidelberg Springer-Verlag 01.12.2010
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Summary:The depth profile of ITO on glass was measured by the time-of-flight secondary ion mass spectroscopy (TOFSIMS) which revealed high sodium (Na) ion concentration at the ITO surface as well as at the ITO–glass interface as a result of out diffusion with substrate heating. Effects of Na ions on the performance of organic light-emitting diode (OLED) were studied by etching away a few tens of nanometers off the ITO surface with a dilute aquaregia solution of HNO 3 :HCl:H 2 O. A single-layer, molecularly doped ITO/(PVK+TPD+Alq 3 )/Al OLEDs were fabricated on bare and etched ITO samples. Although the removal of a 10-nm layer of ITO surface increased the voltage range, brightness, and lifetime, it was insufficient to correlate these improvements with solely to the Na ion reduction without considering the surface roughness.
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ISSN:0947-8396
1432-0630
DOI:10.1007/s00339-010-5913-8