Modelling of field emitter surface structure

The paper presents a mathematical model of the crystal structure of the emitter, which is the subject of research in atom probe tomography and in the field electron microscopy. Electronic, mechanical and other properties of the sample having the shape of the tip with a radius of curvature at the top...

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Bibliographic Details
Published inJournal of physics. Conference series Vol. 643; no. 1; pp. 12010 - 12014
Main Authors Nikiforov, K A, Egorov, N V, Lunkovskiy, M N
Format Journal Article
LanguageEnglish
Published Bristol IOP Publishing 02.11.2015
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Summary:The paper presents a mathematical model of the crystal structure of the emitter, which is the subject of research in atom probe tomography and in the field electron microscopy. Electronic, mechanical and other properties of the sample having the shape of the tip with a radius of curvature at the top of the order of hundred nanometers, these methods are considered on the basis of field desorption and emission (electron or ion). Strong electric field simultaneously performs generating, focusing, accelerating and transport function. Therefore, multi-scale modeling of the properties of the sample, including an approximation of its shape on the micro-, meso- and nanolevel, calculation of atomic packing density and size of crystal faces is a topical applications and is used to interpret the results of field emission experiment.
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ISSN:1742-6588
1742-6596
DOI:10.1088/1742-6596/643/1/012010