Resistive-Gate Field-Effect Transistor: A Novel Steep-Slope Device Based on a Metal-Insulator-Metal-Oxide Gate Stack
A novel silicon-based resistive-gate field-effect transistor (ReFET) with metal-insulator-metal-oxide gate stack is proposed. With the abrupt resistance change event from high-resistance state to low-resistance state in the introduced insulator layer, the threshold voltage of ReFET can be suddenly d...
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Published in | IEEE electron device letters Vol. 35; no. 8; pp. 877 - 879 |
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Main Authors | , , , , |
Format | Journal Article |
Language | English |
Published |
New York, NY
IEEE
01.08.2014
Institute of Electrical and Electronics Engineers The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subjects | |
Online Access | Get full text |
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Summary: | A novel silicon-based resistive-gate field-effect transistor (ReFET) with metal-insulator-metal-oxide gate stack is proposed. With the abrupt resistance change event from high-resistance state to low-resistance state in the introduced insulator layer, the threshold voltage of ReFET can be suddenly decreased, resulting in an abrupt switching of drain current. The device is capable of sub-60-mV/decade subthreshold slope (SS), as well as MOSFET-comparable ON-current. The fabricated n-type ReFET device with Pt/TiN/TaO x /Poly-Si/SiO 2 gate stack can achieve steep SS of 8 mV/decade. With future materials and threshold voltage optimization, high I ON /I OFF ratio with reduced operation voltage can be expected, which shows that ReFET is a promising candidate for ultralow power applications. |
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ISSN: | 0741-3106 1558-0563 |
DOI: | 10.1109/LED.2014.2327219 |