Resistive-Gate Field-Effect Transistor: A Novel Steep-Slope Device Based on a Metal-Insulator-Metal-Oxide Gate Stack

A novel silicon-based resistive-gate field-effect transistor (ReFET) with metal-insulator-metal-oxide gate stack is proposed. With the abrupt resistance change event from high-resistance state to low-resistance state in the introduced insulator layer, the threshold voltage of ReFET can be suddenly d...

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Bibliographic Details
Published inIEEE electron device letters Vol. 35; no. 8; pp. 877 - 879
Main Authors Huang, Qianqian, Huang, Ru, Pan, Yue, Tan, Shenghu, Wang, Yangyuan
Format Journal Article
LanguageEnglish
Published New York, NY IEEE 01.08.2014
Institute of Electrical and Electronics Engineers
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
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Summary:A novel silicon-based resistive-gate field-effect transistor (ReFET) with metal-insulator-metal-oxide gate stack is proposed. With the abrupt resistance change event from high-resistance state to low-resistance state in the introduced insulator layer, the threshold voltage of ReFET can be suddenly decreased, resulting in an abrupt switching of drain current. The device is capable of sub-60-mV/decade subthreshold slope (SS), as well as MOSFET-comparable ON-current. The fabricated n-type ReFET device with Pt/TiN/TaO x /Poly-Si/SiO 2 gate stack can achieve steep SS of 8 mV/decade. With future materials and threshold voltage optimization, high I ON /I OFF ratio with reduced operation voltage can be expected, which shows that ReFET is a promising candidate for ultralow power applications.
ISSN:0741-3106
1558-0563
DOI:10.1109/LED.2014.2327219