Electronic structure and self-assembling processes in platinum metalloporphyrins: photoemission and AFM studies

• Published in: Applied physics. A, Materials science & processing Vol. 94; no. 3; pp. 473 - 476
• Main Authors: Belogorokhov, A. I., Bozhko, S. I., Chaika, A. N., Ionov, A. M., Trophimov, S. A., Rumiantseva, V. D., Vyalikh, D.
• Format: Journal Article
• Language: English
• Published: Berlin/Heidelberg Springer-Verlag 01.03.2009
• Subjects: Atomic force microscopy; Characterization and Evaluation of Materials; Condensed Matter Physics; Electronic structure; Machines; Manufacturing; Nanotechnology; Optical and Electronic Materials; Physics; Physics and Astronomy; Platinum; Processes; Spectra; Surfaces and Interfaces; Thin Films; Topography; Valence band; X-ray photoelectron spectroscopy; 73.20.At; 79.60.Fr
• ISSN: 0947-8396; 1432-0630
• DOI: 10.1007/s00339-008-4909-0

The main goal of this paper is to investigate the electronic structure of valence band and core levels as well as surface topography of pristine tetraphenylporphyrin and Pt-based compounds Pt-TPP(p-COOH 3 ) 4 , Pt-TPP(m-OCH 3 ) 4 , PtCl 2 -TPP(m-OCH 3 ) 4 thin films. The electronic structure of various Pt-based metalloporphyrins which were investigated in dependence on their chemical structure and spectra were measured by high-resolution X-ray photoelectron spectroscopy (XPS) of valence band and Pt4f, Pt4d, C1s, O1s, N1s core levels. Results of atomic force microscopy (AFM) studies of topography and self-assembling processes in thin films of porphyrines are presented and discussed.