A Universal Geometry for Calculable Frequency-Response Coefficient of LCR Standards and New 10-MHz Resistance and 1.6-MHz Quadrature-Bridge Systems

• Published in: IEEE transactions on instrumentation and measurement Vol. 56; no. 2; pp. 221 - 225
• Main Authors: Fujimoto, H., Mana, G., Nakayama, K.
• Format: Journal Article
• Language: English
• Published: New York IEEE 01.04.2007; The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
• Subjects: Beams (radiation); Bridge circuits; Capacitance and resistance standards; coaxial bridges; Coaxial components; Diffraction; Electrical resistance measurement; Frequency measurement; Geometry; h igh-frequency (HF) impedance metrology; Hafnium; i nductance-capacitance-resistance ( LCR ) meters; impedance analyzers (IAs); Impedance measurement; inductance; Instrumentation; Laboratories; Laser interferometry; Measurement standards; Metrology; Origins; quadrifilars; quantum Hall resistance; Silicon; Standards development
• ISSN: 0018-9456; 1557-9662
• DOI: 10.1109/TIM.2007.891143

We present the results of a joint project to identify the origin of a discrepancy between the value of the Si lattice-parameter obtained by the Istituto Nazionale di Ricerca Metrologica and that obtained by the National Metrology Institute of Japan. The re-evaluation of diffraction in the laser interferometry indicates that misalignment of the interfering beams could account for the observed difference