Transient optical non-linearity in p-Si induced by a few cycle extreme THz field
We study the impact of a few cycle extreme terahertz (THz) radiation (the field strength E ∼1-15 MV/cm is well above the DC-field breakdown threshold) on a p-doped Si wafer. Pump-probe measurements of the second harmonic of a weak infrared probe were done at different THz field strengths. The second...
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Published in | Optics express Vol. 29; no. 4; pp. 5730 - 5740 |
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Main Authors | , , , , , , , |
Format | Journal Article |
Language | English |
Published |
United States
15.02.2021
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Online Access | Get full text |
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Summary: | We study the impact of a few cycle extreme terahertz (THz) radiation (the field strength E
∼1-15 MV/cm is well above the DC-field breakdown threshold) on a p-doped Si wafer. Pump-probe measurements of the second harmonic of a weak infrared probe were done at different THz field strengths. The second harmonic yield has an unusual temporal behavior and does not follow the common instantaneous response, ∝
TH
2. These findings were attributed to: (i) the lattice strain by the ponderomotive force of the extreme THz pulse at the maximal THz field strength below 6 MV/cm and (ii) the modulation of the THz field-induced impact ionization rate at the optical probe frequency (due to the modulation of the free carriers' drift kinetic energy from the probe field) at the THz field strength above 6-8 MV/cm. |
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Bibliography: | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 23 |
ISSN: | 1094-4087 1094-4087 |
DOI: | 10.1364/OE.415354 |