Secondary ion mass spectrometry for bone research

• Published in: Biointerphases Vol. 18; no. 4
• Main Authors: Kern, Christine, Kern, Stefanie, Henss, Anja, Rohnke, Marcus
• Format: Journal Article
• Language: English
• Published: United States 01.07.2023
• Subjects: Biocompatible Materials; Bone and Bones; Spectrometry, Mass, Secondary Ion; Staining and Labeling
• ISSN: 1934-8630; 1559-4106; 1559-4106
• DOI: 10.1116/6.0002820

The purpose of this Tutorial is to highlight the suitability of time-of-flight secondary ion mass spectrometry (ToF-SIMS) and OrbiTrap™ SIMS (Orbi-SIMS) in bone research by introducing fundamentals and best practices of bone analysis with these mass spectrometric imaging (MSI) techniques. The Tutorial includes sample preparation, determination of best-suited measurement settings, data acquisition, and data evaluation, as well as a brief overview of SIMS applications in bone research in the current literature. SIMS is a powerful analytical technique that allows simultaneous analysis and visualization of mineralized and nonmineralized bone tissue, bone marrow as well as implanted biomaterials, and interfaces between bone and implants. Compared to histological staining, which is the standard analytical procedure in bone research, SIMS provides chemical imaging of nonstained bone sections that offers insights beyond what is conventionally obtained. The Tutorial highlights the versatility of ToF- and Orbi-SIMS in addressing important questions in bone research. By illustrating the value of these MSI techniques, it demonstrates how they can contribute to advance progress in bone research.