Multi-characterization for Electromagnetic Interference in Electronic Circuits for CaPb-based W-type Hexaferrites

• Published in: Arabian journal for science and engineering (2011) Vol. 49; no. 1; pp. 1117 - 1130
• Main Authors: Anjum, Rashida, Khan, Hasan M., Li, Zhi, Aslam, Muhamamd, Sadiq, Imran, Batool, Zahida, Panwar, M. N., Akhtar, Tahira, AlObaid, Abeer A., Nazir, Ghazanfar, Zahid, Muhammad
• Format: Journal Article
• Language: English
• Published: Berlin/Heidelberg Springer Berlin Heidelberg 2024; Springer Nature B.V
• Subjects: Absorption spectra; Crystallites; Dielectric loss; Electromagnetic interference; Electronic circuits; Engineering; Fourier transforms; Humanities and Social Sciences; Infrared spectroscopy; multidisciplinary; Parameters; Photomicrographs; Research Article-Physics; Science; Sol-gel processes; Spectrum analysis; Ferrites; XRD; Sol–gel process; Di-electric; Structural properties; Hexaferrites
• ISSN: 2193-567X; 1319-8025; 2191-4281
• DOI: 10.1007/s13369-023-08031-0

Due to the excessive use of electronic devices in this modern technological age, the issue of electromagnetic interference (EMI) has become a concern. To address this, Ca–Pb W-type hexaferrites were synthesized with the composition Ca 0.5 Pb 0.5 Co 2− x Mg x La y Fe 16− y O 27 , where x and y vary between 0.0 and 1.0, with a step of 0.2 and 0.02, respectively. The samples were prepared using the sol–gel auto-combustion method. The results of the X-ray diffraction analysis showed the formation of a single-phase hexaferrite structure by examining its structural parameters. This was confirmed as all the peaks observed matched the reference pattern stored in the ICDD database with the number 01-082-0041. Scherrer’s formula was used to calculate crystallites size which ranged from 41 to 76 nm. The formation of hexaferrites was confirmed using Fourier transform infrared spectroscopy, which detected two absorption bands below 1000 cm −1 . Energy-dispersive X-ray spectroscopy revealed that all of the sample’s elements were present. Scanning electron microscopy micrographs revealed the shape and distribution of the particles. Frequency-dependent dielectric parameters were evaluated for all concentrations in a range between 1.0 MHz and 3 GHz. At frequencies that are relatively low, the materials exhibit high values of both dielectric constant and dielectric loss. Furthermore, the AC conductivity of these materials is significantly low at lower frequencies. However, as the frequency increases, the conductivity of the materials gradually begins to increase, and this rise is marked by the emergence of resonance peaks. These characteristics make the material well-suited for use as electromagnetic interference (EMI) filters and chokes.