Diffraction of evanescent waves and nanomechanical displacement detection
Sensitive displacement detection has emerged as a significant technological challenge in mechanical resonators with nanometer-scale dimensions. A novel nanomechanical displacement detection scheme based upon the scattering of focused evanescent fields is proposed. The sensitivity of the proposed app...
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Published in | Optics letters Vol. 32; no. 13; p. 1881 |
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Main Authors | , , , , , , , |
Format | Journal Article |
Language | English |
Published |
United States
01.07.2007
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Online Access | Get more information |
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