Diffraction of evanescent waves and nanomechanical displacement detection

Sensitive displacement detection has emerged as a significant technological challenge in mechanical resonators with nanometer-scale dimensions. A novel nanomechanical displacement detection scheme based upon the scattering of focused evanescent fields is proposed. The sensitivity of the proposed app...

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Bibliographic Details
Published inOptics letters Vol. 32; no. 13; p. 1881
Main Authors Karabacak, Devrez M, Ekinci, Kamil L, Gan, Choon How, Gbur, Gregory J, Unlü, M Selim, Ippolito, Stephen B, Goldberg, Bennett B, Carney, P Scott
Format Journal Article
LanguageEnglish
Published United States 01.07.2007
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