Diffraction of evanescent waves and nanomechanical displacement detection

Sensitive displacement detection has emerged as a significant technological challenge in mechanical resonators with nanometer-scale dimensions. A novel nanomechanical displacement detection scheme based upon the scattering of focused evanescent fields is proposed. The sensitivity of the proposed app...

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Bibliographic Details
Published inOptics letters Vol. 32; no. 13; p. 1881
Main Authors Karabacak, Devrez M, Ekinci, Kamil L, Gan, Choon How, Gbur, Gregory J, Unlü, M Selim, Ippolito, Stephen B, Goldberg, Bennett B, Carney, P Scott
Format Journal Article
LanguageEnglish
Published United States 01.07.2007
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Summary:Sensitive displacement detection has emerged as a significant technological challenge in mechanical resonators with nanometer-scale dimensions. A novel nanomechanical displacement detection scheme based upon the scattering of focused evanescent fields is proposed. The sensitivity of the proposed approach is studied using diffraction theory of evanescent waves. Diffraction theory results are compared with numerical simulations.
ISSN:0146-9592
DOI:10.1364/OL.32.001881