Optical single layer lift-off process

The lithography of the metal wiring layers is becoming the most confining technology in the era of VLSI (very large-scale integration), as more and more circuits have to be wired on the chip itself. The two competing technologies are subtractive etch (wet or dry), and additive metal lift-off. As lif...

Full description

Saved in:
Bibliographic Details
Published inIEEE transactions on electron devices Vol. 32; no. 3; pp. 672 - 676
Main Author Moritz, H.
Format Journal Article
LanguageEnglish
Published New York, NY IEEE 01.01.1985
Institute of Electrical and Electronics Engineers
Subjects
Online AccessGet full text

Cover

Loading…
More Information
Summary:The lithography of the metal wiring layers is becoming the most confining technology in the era of VLSI (very large-scale integration), as more and more circuits have to be wired on the chip itself. The two competing technologies are subtractive etch (wet or dry), and additive metal lift-off. As lift-off needs no etching, it inherently offers cost and density advantages. It, however, requires an undercut photoresist profile. These undercuts can be achieved with an image-reversal process. The paper describes such a reversal process, especially tuned for lift-off applications. The result is a simple single-layer lift-off technology with excellent image quality.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
ISSN:0018-9383
1557-9646
DOI:10.1109/T-ED.1985.21997