Averaged power spectrum density, fractal and multifractal spectra of Au nano-particles deposited onto annealed TiO2 thin films
This work describes the morphology of titanium oxide (TiO 2 ) thin films deposited by gold nanoparticles and produced at room temperature over Si(100) wafers. A direct-current (DC) reactive magnetron sputtering process was applied for the sample preparation. Then, their three-dimensional (3-D) surfa...
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Published in | Optical and quantum electronics Vol. 52; no. 11 |
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Main Authors | , , , , , |
Format | Journal Article |
Language | English |
Published |
New York
Springer US
01.11.2020
Springer Nature B.V |
Subjects | |
Online Access | Get full text |
ISSN | 0306-8919 1572-817X |
DOI | 10.1007/s11082-020-02584-2 |
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Abstract | This work describes the morphology of titanium oxide (TiO
2
) thin films deposited by gold nanoparticles and produced at room temperature over Si(100) wafers. A direct-current (DC) reactive magnetron sputtering process was applied for the sample preparation. Then, their three-dimensional (3-D) surface characterization was carried out by using atomic force microscopy (AFM). Stereometric analysis was carrying out on the basis of AFM-data, and the surface topography was described according to ISO 25,178–2:2012 standard. As can be seen, the surface of sample #3 has the most regular topography (Df = 2.70 ± 0.01) with the most regular surface (Sq = 0.97 nm). The most irregular topography (Df = 2.83 ± 0.01) was found in sample #2, while the most irregular surface (Sq = 3.38 nm) was found in sample #1. |
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AbstractList | This work describes the morphology of titanium oxide (TiO2) thin films deposited by gold nanoparticles and produced at room temperature over Si(100) wafers. A direct-current (DC) reactive magnetron sputtering process was applied for the sample preparation. Then, their three-dimensional (3-D) surface characterization was carried out by using atomic force microscopy (AFM). Stereometric analysis was carrying out on the basis of AFM-data, and the surface topography was described according to ISO 25,178–2:2012 standard. As can be seen, the surface of sample #3 has the most regular topography (Df = 2.70 ± 0.01) with the most regular surface (Sq = 0.97 nm). The most irregular topography (Df = 2.83 ± 0.01) was found in sample #2, while the most irregular surface (Sq = 3.38 nm) was found in sample #1. This work describes the morphology of titanium oxide (TiO 2 ) thin films deposited by gold nanoparticles and produced at room temperature over Si(100) wafers. A direct-current (DC) reactive magnetron sputtering process was applied for the sample preparation. Then, their three-dimensional (3-D) surface characterization was carried out by using atomic force microscopy (AFM). Stereometric analysis was carrying out on the basis of AFM-data, and the surface topography was described according to ISO 25,178–2:2012 standard. As can be seen, the surface of sample #3 has the most regular topography (Df = 2.70 ± 0.01) with the most regular surface (Sq = 0.97 nm). The most irregular topography (Df = 2.83 ± 0.01) was found in sample #2, while the most irregular surface (Sq = 3.38 nm) was found in sample #1. |
ArticleNumber | 491 |
Author | Yadav, Ram Pratap Nezafat, Negin Beryani Achour, Amine Ţălu, Ştefan Solaymani, Shahram Rezaee, Sahar |
Author_xml | – sequence: 1 givenname: Shahram surname: Solaymani fullname: Solaymani, Shahram organization: Department of Physics, Kermanshah Branch, Islamic Azad University – sequence: 2 givenname: Ram Pratap surname: Yadav fullname: Yadav, Ram Pratap organization: Physics Department, Deen Dayal Upadhyay Govt. P.G. College – sequence: 3 givenname: Ştefan surname: Ţălu fullname: Ţălu, Ştefan organization: The Directorate of Research, Development and Innovation Management (DMCDI), Technical University of Cluj-Napoca – sequence: 4 givenname: Amine surname: Achour fullname: Achour, Amine organization: Research Centre in Physics of Matter and Radiation (PMR), LISE Laboratory, University of Namur – sequence: 5 givenname: Sahar orcidid: 0000-0001-5034-0810 surname: Rezaee fullname: Rezaee, Sahar email: saharrezaee593@iauksh.ac.ir organization: Department of Physics, Kermanshah Branch, Islamic Azad University – sequence: 6 givenname: Negin Beryani surname: Nezafat fullname: Nezafat, Negin Beryani organization: School of Physics, Institute for Research in Fundamental Sciences (IPM) |
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) thin films deposited by gold nanoparticles and produced at room temperature over Si(100) wafers.... This work describes the morphology of titanium oxide (TiO2) thin films deposited by gold nanoparticles and produced at room temperature over Si(100) wafers. A... |
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SubjectTerms | Atomic force microscopy Characterization and Evaluation of Materials Computer Communication Networks Electrical Engineering Gold Lasers Magnetron sputtering Morphology Nanoparticles Optical Devices Optics Photonics Physics Physics and Astronomy Room temperature Surface properties Thin films Titanium dioxide Titanium oxides Topography |
Title | Averaged power spectrum density, fractal and multifractal spectra of Au nano-particles deposited onto annealed TiO2 thin films |
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