Resonance Raman Scattering Spectroscopy of Four-Monolayer Thick MoS2 Films

We studied the Raman scattering in bulk and four-monolayer thick MoS 2 films under the resonance laser excitation of A, B, and C excitons. We demonstrate the fine structure agility of a phonon mode associated with out-of-plane vibration of sulfur atoms (A 1 g ) when passing from bulk to atomically t...

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Bibliographic Details
Published inJournal of Russian laser research Vol. 40; no. 3; pp. 269 - 273
Main Authors Bagaev, V. S., Krivobok, V. S., Nikolaev, S. N., Chernopitssky, M. A., Savin, K. A.
Format Journal Article
LanguageEnglish
Published New York Springer US 15.05.2019
Springer Nature B.V
Subjects
Excitation
Excitons
Fine structure
Lasers
Microwaves
Molybdenum disulfide
Monolayers
Optical Devices
Optics
Phonons
Photonics
Physics
Physics and Astronomy
Raman spectra
Resonance scattering
RF and Optical Engineering
Thick films
Thin films
transition metal dichalcogenides
Raman scattering
exciton
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Summary:We studied the Raman scattering in bulk and four-monolayer thick MoS 2 films under the resonance laser excitation of A, B, and C excitons. We demonstrate the fine structure agility of a phonon mode associated with out-of-plane vibration of sulfur atoms (A 1 g ) when passing from bulk to atomically thin film. The C exciton resonance excitation allows us to register the line corresponding to optical-phonon (E 1 g ) scattering and the set of peaks with a 660 – 740 cm − 1 Stokes shift associated with resonance scattering by two optical (E u ) phonons.
ISSN:1071-2836
1573-8760
DOI:10.1007/s10946-019-09801-8