Structural, electronic and optical properties of GeX (X = N, P and As) monolayer: under stress and strain conditions
Applying first-principles of Density Functional Theory, the current study aims to discover optical, structural and electronic features of two-dimensional (2D) hexagonal structure of IV–V binary monolayer compounds, GeX (X = N, P and As) under the conditions of stress and strain. The findings reveale...
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Published in | Optical and quantum electronics Vol. 53; no. 9 |
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Main Authors | , , |
Format | Journal Article |
Language | English |
Published |
New York
Springer US
01.09.2021
Springer Nature B.V |
Subjects | |
Online Access | Get full text |
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Summary: | Applying first-principles of Density Functional Theory, the current study aims to discover optical, structural and electronic features of two-dimensional (2D) hexagonal structure of IV–V binary monolayer compounds, GeX (X = N, P and As) under the conditions of stress and strain. The findings revealed that applying stress and strain conditions may make an adjustable energy gap which has a linear tendency. The valance band maximum and conduction band minimum graph is susceptible to exert strain and stress. Furthermore, a blue shift appears in the optical spectra of monolayer structures under compressive strain conditions, although a red shift is observed in the optical spectra of materials as a result of applying tensile strain. The findings show that the GeX monolayers are possibly promising applicants to be used in new optoelectronic applications. |
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Bibliography: | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 14 |
ISSN: | 0306-8919 1572-817X |
DOI: | 10.1007/s11082-021-03134-0 |