Structural, electronic and optical properties of GeX (X = N, P and As) monolayer: under stress and strain conditions

Applying first-principles of Density Functional Theory, the current study aims to discover optical, structural and electronic features of two-dimensional (2D) hexagonal structure of IV–V binary monolayer compounds, GeX (X = N, P and As) under the conditions of stress and strain. The findings reveale...

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Published inOptical and quantum electronics Vol. 53; no. 9
Main Authors Niasadegh, Noureddin, Naseri, Mosayeb, Rezaee, Sahar
Format Journal Article
LanguageEnglish
Published New York Springer US 01.09.2021
Springer Nature B.V
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Summary:Applying first-principles of Density Functional Theory, the current study aims to discover optical, structural and electronic features of two-dimensional (2D) hexagonal structure of IV–V binary monolayer compounds, GeX (X = N, P and As) under the conditions of stress and strain. The findings revealed that applying stress and strain conditions may make an adjustable energy gap which has a linear tendency. The valance band maximum and conduction band minimum graph is susceptible to exert strain and stress. Furthermore, a blue shift appears in the optical spectra of monolayer structures under compressive strain conditions, although a red shift is observed in the optical spectra of materials as a result of applying tensile strain. The findings show that the GeX monolayers are possibly promising applicants to be used in new optoelectronic applications.
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ISSN:0306-8919
1572-817X
DOI:10.1007/s11082-021-03134-0