Progress in focal plane array technologies

• Published in: Progress in quantum electronics Vol. 36; no. 2-3; pp. 342 - 473
• Main Author: Rogalski, Antoni
• Format: Journal Article
• Language: English
• Published: Elsevier Ltd 01.03.2012
• Subjects: Infrared detectors; Monolithic and hybrid focal plane arrays; Ultraviolet detectors; Visible detectors; X-ray detectors; Infrared detectors; Visible detectors; Ultraviolet detectors; X-ray detectors; Monolithic and hybrid focal plane arrays
• ISSN: 0079-6727; 1873-1627
• DOI: 10.1016/j.pquantelec.2012.07.001

Development of focal plane arrays started in seventies last century and has revolutionized imaging systems in the next decades. This paper presents progress in optical detector technology of focal plane arrays during the past twenty years. At the beginning of paper, emphasises are given on integrated detector assembly and cooling requirements of different types of detectors. Next, the classification of two types of detectors (photon detectors and thermal detectors) is done on the basis of their principle of operation. This topic is followed by general overview of focal plane array architectures. The main subject of paper is concentrated on describing of material systems and detectors operated in different spectral ranges. Special attention is given on recent progress in their detector technologies. Discussion is focused mainly on current and the most rapidly developing focal plane arrays including: CdZnTe detectors, AlGaN photodiodes, visible CCD and CMOS imaging systems, HgCdTe heterostructure photodiodes, quantum well AlGaAs/GaAs photoresistors, and thermal detectors. Emphasis is also given on far-infrared and sub-millimetre wave detector arrays. Finally, the outlook for near-future trends in optical detector technologies is presented.