The effect of cesium metal clusters on the optical properties of cesium iodide thin films

• Published in: Applied physics. A, Materials science & processing Vol. 99; no. 1; pp. 305 - 310
• Main Authors: Kumar, Kuldeep, Arun, P., Kant, Chhaya Ravi, Mehra, N. C., Mathew, Vincent
• Format: Journal Article
• Language: English
• Published: Berlin/Heidelberg Springer-Verlag 01.04.2010; Springer
• Subjects: Characterization and Evaluation of Materials; Condensed Matter Physics; Condensed matter: electronic structure, electrical, magnetic, and optical properties; Exact sciences and technology; Machines; Manufacturing; Nanotechnology; Optical and Electronic Materials; Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation; Optical properties of specific thin films; Physics; Physics and Astronomy; Processes; Surfaces and Interfaces; Thin Films; Surface Plasmon Resonance; Cesium; Atomic Force Microscope Image; Metal Cluster; Atomic Force Microscope; Thin films; Red shift; Optical properties; Insulating thin films; Surface plasmon resonance; Evaporation; Metal clusters; Permittivity; Spectral line shift; Cesium iodide
• ISSN: 0947-8396; 1432-0630
• DOI: 10.1007/s00339-009-5532-4

Cesium metal clusters strongly affect the optical properties of cesium iodide thin films. The metal clusters are formed during film formation by thermal evaporation. The cesium cluster of 30–40 nm in the matrix of cesium iodide insulating thin films results in Surface Plasmon Resonance (SPR). The peak position of these SPR peaks showed a red shift. This was shown to be due to changes in the dielectric constant of CsI resulting from the strains in the films caused by the metal clusters themselves.