Quantitative local profile analysis of nanomaterials by electron diffraction

A method yielding a quantitative profile analysis from electron diffraction is worked out and combined with the local information gained from transmission electron microscopy images; it is applicable to various nanomaterials. As an example, small nanocrystalline regions are analyzed that form in FeA...

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Bibliographic Details
Published inScripta materialia Vol. 63; no. 3; pp. 312 - 315
Main Authors Gammer, C., Mangler, C., Rentenberger, C., Karnthaler, H.P.
Format Journal Article
LanguageEnglish
Published Elsevier Ltd 01.08.2010
Subjects
Intermetallic FeAl
Nanocrystalline materials
Severe plastic deformation (SPD)
Transmission electron microscopy (TEM)
Severe plastic deformation (SPD)
Nanocrystalline materials
Transmission electron microscopy (TEM)
Intermetallic FeAl
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Summary:A method yielding a quantitative profile analysis from electron diffraction is worked out and combined with the local information gained from transmission electron microscopy images; it is applicable to various nanomaterials. As an example, small nanocrystalline regions are analyzed that form in FeAl by severe plastic deformation. The result is unexpected as the coherently scattering domain size does not change as a function of strain. At high strains, the sample is homogeneously nanocrystalline and the results agree well with those of X-ray diffraction.
ISSN:1359-6462
1872-8456
DOI:10.1016/j.scriptamat.2010.04.019