Impact of a HTO/Al2O3 bi-layer blocking oxide in nitride-trap non-volatile memories
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Published in | Solid-state electronics Vol. 53; no. 7; pp. 786 - 791 |
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Main Authors | , , , , , , , , , , , , , , |
Format | Conference Proceeding Journal Article |
Language | English |
Published |
Kidlington
Elsevier
01.07.2009
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Subjects | |
Online Access | Get full text |
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ISSN: | 0038-1101 1879-2405 |
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DOI: | 10.1016/j.sse.2009.03.018 |