Variable angle spectroscopic ellipsometry: application to poled polymers for non-linear optics

We present variable angle spectroscopic ellipsometry characterization of polymeric films for optoelectronics. This characterization allows us to monitor the thickness variation of the films through the main steps of the process, suggesting possible improvements of the process itself. Spectroscopic c...

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Bibliographic Details
Published inThin solid films Vol. 234; no. 1-2; pp. 454 - 457
Main Authors Toussaere, E., Zyss, J.
Format Journal Article Conference Proceeding
LanguageEnglish
Published Lausanne Elsevier B.V 25.10.1993
Elsevier Science
Subjects
Exact sciences and technology
Instruments, apparatus, components and techniques common to several branches of physics and astronomy
Optical instruments, equipment and techniques
Physics
Polarimeters and ellipsometers
Characterization
Thin films
Spectroscopic ellipsometry
Chemical structure
Experimental study
Polymers
Nonlinear optics
Ellipsometry
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Summary:We present variable angle spectroscopic ellipsometry characterization of polymeric films for optoelectronics. This characterization allows us to monitor the thickness variation of the films through the main steps of the process, suggesting possible improvements of the process itself. Spectroscopic characterization of baked but non-oriented films suggests strong interaction between the chromophores. Finally, the measurements allow us to calculate the birefringence of corona-poled films throughout their transparency domain.
ISSN:0040-6090
1879-2731
DOI:10.1016/0040-6090(93)90306-A