Improvement on "Sequential Testing" in MIL-HDBK-781A and IEC 61124

• Published in: IEEE transactions on reliability Vol. 57; no. 2; pp. 379 - 387
• Main Authors: Michlin, Y.H., Meshkov, L., Grunin, I.
• Format: Journal Article
• Language: English
• Published: New York IEEE 01.06.2008; The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
• Subjects: Absorption; Algorithms; Councils; Educational programs; Exponential distribution; Failure analysis; IEC standards; Mean time between failures; Probability; Sequential analysis; sequential testing; Studies; Technology management; test truncation; Testing
• ISSN: 0018-9529; 1558-1721
• DOI: 10.1109/TR.2008.916886

This paper presents results of an analysis of the sequential test (ST) procedures described in MIL-HDBK-781A, and IEC 61124, intended for checking the mean Time Between Failures (TBF) value under an exponential distribution of the TBF. The methodological basis of the calculations consists in discretization of the ST process through subdivision of the time axis in small segments. By this means, the process is converted into a binomial for which an algorithm, and a fast computer program have been developed; and most important of all, a tool is provided for searching for the optimal truncation. The influence of truncation by time on the Expected Test Time (ETT) characteristics was studied; and an improved truncation method, minimizing this influence, was developed. The distributions of the test times were determined. The type A plan characteristics in IEC 61124:2006 have substantial inconsistencies in the probabilities of types I & II errors (up to a factor of 2), and in the ETT (up to 17%). We checked these results by using the binomial-recursive method, and by simulation. The Type C plans, reproduced from GOST R27.402:2005, are consistent; but there is scope (and need) for substantial improvement of the search algorithm for the optimal parameters.