Defects and disorder in apatite-type silicate oxide ion conductors: implications for conductivity

The structure and composition of La-silicate apatite oxide ion conductor, La 10 Si 6 O 27 , in which the types of defects it contains are controversial, has been thoroughly investigated. Large crystals were grown using the floating zone method, and their structure was characterised by X-ray and neut...

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Published inJournal of materials chemistry. A, Materials for energy and sustainability Vol. 1; no. 27; pp. 14576 - 14584
Main Authors Fuller, Chloe A, Gutmann, Matthias J, Ling, Chris D, Wang, Chun-Hai, Zhang, Weiguo, Halasyamani, P. Shiv, Evans, Ivana Radosavljevic, Evans, John S. O
Format Journal Article
LanguageEnglish
Published Cambridge Royal Society of Chemistry 12.07.2022
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Summary:The structure and composition of La-silicate apatite oxide ion conductor, La 10 Si 6 O 27 , in which the types of defects it contains are controversial, has been thoroughly investigated. Large crystals were grown using the floating zone method, and their structure was characterised by X-ray and neutron single crystal diffraction and second harmonic generation measurements. Structure refinements reveal extensive positional disorder on the oxygen substructure, the presence of La vacancies and no evidence of sites occupied by excess oxide ions. The actual composition of the crystal was determined through SEM-EDX and density measurements and was found to be La 9.64 Si 5.77 O 26 , differing significantly from the nominal composition but in agreement with the structure refinements. Structural models considering the actual composition, the disorder on the O sublattice, and local relaxations around these defects were able to reproduce the key features of the diffuse scattering observed in single crystal neutron diffraction patterns. Extensive diffuse scatter observed by single crystal neutron diffraction was modelled to gain insight into structural distortions in apatite-type lanthanum silicate.
Bibliography:https://doi.org/10.1039/d2ta02328h
Electronic supplementary information (ESI) available: Single crystal neutron diffraction data. See
ISSN:2050-7488
2050-7496
DOI:10.1039/d2ta02328h