Structure and magnetoresistive properties in La–manganite thin films

• Published in: Journal of applied physics Vol. 81; no. 8; pp. 5496 - 5498
• Main Authors: Gommert, E., Cerva, H., Rucki, A., Helmolt, R. v., Wecker, J., Kuhrt, C., Samwer, K.
• Format: Journal Article
• Language: English
• Published: 15.04.1997
• ISSN: 0021-8979; 1089-7550
• DOI: 10.1063/1.364579

This study investigates the structure of perovskite thin films and its influence on their colossal magnetoresistance (CMR) properties. Epitaxial thin films of perovskite manganites La1−xBxMnO3−δ (B=Ca,Sr) were prepared on SrTiO3 (100) substrates using on- and off-axis pulsed laser deposition (PLD) techniques. X-ray diffraction, resistance and magnetoresistance measurements, as well as high-resolution transmission electron microscopy (HRTEM) investigations were carried out. HRTEM observations reveal epitaxial growth for the first few layers of all prepared samples. Thicker on-axis prepared films grow with a large number of defects, whereas off-axis prepared samples grow in a columnar structure. Since the magnetic properties in systems with double-exchange interaction are very sensitive to the local structure it has great influence on the electronic properties.