A Silicon Carbide 256 Pixel UV Image Sensor Array Operating at 400 °C

An image sensor based on wide band gap silicon carbide (SiC) has the merits of high temperature operation and ultraviolet (UV) detection. To realize a SiC-based image sensor the challenge of opto-electronic on-chip integration of SiC photodetectors and digital electronic circuits must be addressed....

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Bibliographic Details
Published inIEEE journal of the Electron Devices Society Vol. 8; pp. 116 - 121
Main Authors Hou, Shuoben, Shakir, Muhammad, Hellstrom, Per-Erik, Malm, Bengt Gunnar, Zetterling, Carl-Mikael, Ostling, Mikael
Format Journal Article
LanguageEnglish
Published New York IEEE 2020
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
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Summary:An image sensor based on wide band gap silicon carbide (SiC) has the merits of high temperature operation and ultraviolet (UV) detection. To realize a SiC-based image sensor the challenge of opto-electronic on-chip integration of SiC photodetectors and digital electronic circuits must be addressed. Here, we demonstrate a novel SiC image sensor based on our in-house bipolar technology. The sensing part has 256 (16×16) pixels. The digital circuit part for row and column selection contains two 4-to-16 decoders and one 8-bit counter. The digital circuits are designed in transistor-transistor logic (TTL). The entire circuit has 1959 transistors. It is the first demonstration of SiC opto-electronic on-chip integration. The function of the image sensor up to 400 °C has been verified by taking photos of the spatial patterns masked from UV light. The image sensor would play a significant role in UV photography, which has important applications in astronomy, clinics, combustion detection and art.
ISSN:2168-6734
2168-6734
DOI:10.1109/JEDS.2020.2966680