Response compaction for system-on-a-chip based on advanced convolutional codes

• Published in: Science China. Information sciences Vol. 49; no. 2; pp. 262 - 272
• Main Authors: Han, Yinhe, Li, Huawei, Li, Xiaowei, Anshuman, Chandra
• Format: Journal Article
• Language: English
• Published: Heidelberg Springer Nature B.V 01.04.2006; Institute of Computing Technology, Chinese Academy of Sciences, Beijing 100080, China; Graduate University of Chinese Academy of Sciences, Beijing 100039, China%Synopsys, Inc., 700 E. Middlefield Rd., Mountain View, CA 94043, USA
• Subjects: Algorithms; System on chip; 卷积码; 响应压制; SOC test; convolutional code; response compaction; aliasing; X bits masking
• ISSN: 1009-2757; 1674-733X; 1862-2836; 1869-1919
• DOI: 10.1007/s11432-006-0262-0

This paper addresses the problem of test response compaction. In order to maximize compaction ratio, a single-output compactor based on a （n, n-1, m, 3） convolutional code is presented. When the proposed theorems are satisfied, the compactor can avoid two and any odd erroneous bits cancellations, and handle one unknown bit （X bit）. When the X bits in response are clustered, multiple-weight check matrix design algorithm can be used to reduce the effect of massive X bits. Some extended experimental results show that the proposed encoder has an acceptable-level X tolerant capacity and low error cancellations probability.