Investigation of β-Ga2O3 films and β-Ga2O3/GaN heterostructures grown by metal organic chemical vapor deposition
In this work, (-2 0 1) β-Ga 2 O 3 films are grown on GaN substrate by metal organic chemical vapor deposition (MOCVD). It is revealed that the β-Ga 2 O 3 film grown on GaN possesses superior crystal quality, material homogeneity and surface morphology than the results of common heteroepitaxial β-Ga...
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Published in | Science China. Physics, mechanics & astronomy Vol. 63; no. 11; p. 117311 |
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Main Authors | , , , , , , , , |
Format | Journal Article |
Language | English |
Published |
Beijing
Science China Press
01.11.2020
Springer Nature B.V |
Subjects | |
Online Access | Get full text |
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Summary: | In this work, (-2 0 1) β-Ga
2
O
3
films are grown on GaN substrate by metal organic chemical vapor deposition (MOCVD). It is revealed that the β-Ga
2
O
3
film grown on GaN possesses superior crystal quality, material homogeneity and surface morphology than the results of common heteroepitaxial β-Ga
2
O
3
film based on sapphire substrate. Further, the relevance between the crystal quality of epitaxial β-Ga
2
O
3
film and the β-Ga
2
O
3
/GaN interface behavior is investigated. Transmission electron microscopy result indicates that the interface atom refactoring phenomenon is beneficial to relieve the mismatch strain and improve the crystal quality of subsequent β-Ga
2
O
3
film. Moreover, the energy band structure of β-Ga
2
O
3
/GaN heterostructure grown by MOCVD is investigated by X-ray photoelectron spectroscopy and a large conduction band offset of 0.89 eV is obtained. The results in this work not only convincingly demonstrate the advantages of β-Ga
2
O
3
films grown on GaN substrate, but also show the great application potential of MOCVD β-Ga
2
O
3
/GaN heterostructures in microelectronic applications. |
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ISSN: | 1674-7348 1869-1927 |
DOI: | 10.1007/s11433-019-1546-3 |